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Kelvin Probe Force Microscopy applied to GaSb and GeSb thin films

Kamminga, M.E. (2012) Kelvin Probe Force Microscopy applied to GaSb and GeSb thin films. Bachelor's Thesis, Physics.

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Abstract

De begeleider en/of auteur heeft geen toestemming gegeven tot het openbaar maken van de scriptie. The supervisor and/or the author did not authorize public publication of the thesis.

Item Type: Thesis (Bachelor's Thesis)
Degree programme: Physics
Thesis type: Bachelor's Thesis
Language: English
Date Deposited: 15 Feb 2018 07:50
Last Modified: 15 Feb 2018 07:50
URI: http://fse.studenttheses.ub.rug.nl/id/eprint/10377

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