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Shadow artifacts in high-resolution computed tomography measurements

Klok, Mark van der (2018) Shadow artifacts in high-resolution computed tomography measurements. Internship Report, Applied Physics.

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Abstract

De begeleider en/of auteur heeft geen toestemming gegeven tot het openbaar maken van de scriptie. The supervisor and/or the author did not authorize public publication of the thesis.

Item Type: Thesis (Internship Report)
Supervisor:
Supervisor nameSupervisor E mail
Onck, P.R.P.R.Onck@rug.nl
Degree programme: Applied Physics
Thesis type: Internship Report
Language: English
Date Deposited: 27 Aug 2018
Last Modified: 29 Aug 2018 10:51
URI: http://fse.studenttheses.ub.rug.nl/id/eprint/18400

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