Javascript must be enabled for the correct page display

Electron beam sensitivity of mica

van Berkum, Tess (2018) Electron beam sensitivity of mica. Bachelor's Thesis, Applied Physics.

[img]
Preview
Text
bAppP_2018_vanBerkumT.pdf

Download (49MB) | Preview
[img] Text
toestemming.pdf
Restricted to Registered users only

Download (97kB)

Abstract

Mica is a mineral that has a naturally flat surface with basal and outstanding cleavage, which makes it a good substrate for high quality film growth. In order to study the structure of these thin layers different geometries can be examined by (scanning) transmission electron microscopy ((S)TEM), namely plan-view and cross-section geometries. In this paper a dual beam system is used for preparing TEM-lamellas. The goal of the experiment is to investigate the electron beam sensitivity of mica when it is viewed in cross-section by a (S)TEM. It was found that mica has a certain electron dose threshold in order to conclude if it is damaged or not. The threshold lies in the electron dose range of $4.1 * 10^{-7}$ pC/$\mu$m$^2$ and $8.6 * 10^{-7}$ pC/$\mu$m$^2$ by 30 kV electrons. Furthermore an observation was made that the diffraction patterns vanish inhomogeneously, the out-plane lines decrease earlier than the in-plane lines when the electron dose increases. An equation of a sigmoidal logistic function, $y = A2 + (A1-A2)/(1 + (x./x0)^p)$, is found to express the vanishing of in-plane diffraction lines when the electron dose increases. The benefit of controlling the electron beam damage of mica is that the study of thin layers can be improved.

Item Type: Thesis (Bachelor's Thesis)
Supervisor:
Supervisor nameSupervisor E mail
Momand, J.J.Momand@rug.nl
Kooi, B.J.B.J.Kooi@rug.nl
Palasantzas, G.G.Palasantzas@rug.nl
Degree programme: Applied Physics
Thesis type: Bachelor's Thesis
Language: English
Date Deposited: 03 Dec 2018
Last Modified: 03 Dec 2018 12:57
URI: http://fse.studenttheses.ub.rug.nl/id/eprint/18875

Actions (login required)

View Item View Item