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Characterizing SOT-MRAM devices and their size dependence

van Rijn, Job (2019) Characterizing SOT-MRAM devices and their size dependence. Internship Report, Applied Physics.

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Abstract

De begeleider en/of auteur heeft geen toestemming gegeven tot het openbaar maken van de scriptie. The supervisor and/or the author did not authorize public publication of the thesis.

Item Type: Thesis (Internship Report)
Supervisor:
Supervisor nameSupervisor E mail
Banerjee, T.T.Banerjee@rug.nl
Supervisor (outside RUG):
Supervisor outside RUG nameSupervisor outside RUG E mail
Garello, KevinUNSPECIFIED
Degree programme: Applied Physics
Thesis type: Internship Report
Language: English
Date Deposited: 23 Aug 2019
Last Modified: 23 Aug 2019 14:29
URI: http://fse.studenttheses.ub.rug.nl/id/eprint/20758

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