Ewijk, Chris, van (2019) Micro Four-Point Probe resistance measurements of nanometer-wide features. Master's Internship Report, Applied Physics.
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Abstract
De begeleider en/of auteur heeft geen toestemming gegeven tot het openbaar maken van de scriptie. The supervisor and/or the author did not authorize public publication of the thesis.
| Item Type: | Thesis (Master's Internship Report) |
|---|---|
| Supervisor name: | Kooi, B.J. |
| Degree programme: | Applied Physics |
| Thesis type: | Master's Internship Report |
| Language: | English |
| Date Deposited: | 13 Jan 2020 08:14 |
| Last Modified: | 13 Jan 2020 08:14 |
| URI: | https://fse.studenttheses.ub.rug.nl/id/eprint/21397 |
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