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Contribution of ex situ and in situ X-ray grazing incidence scattering techniques to the understanding of quantum dot self-assembly: A Review

Saxena, Vishesh (2020) Contribution of ex situ and in situ X-ray grazing incidence scattering techniques to the understanding of quantum dot self-assembly: A Review. Research Paper, Nanoscience.

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Abstract

De begeleider en/of auteur heeft geen toestemming gegeven tot het openbaar maken van de scriptie. The supervisor and/or the author did not authorize public publication of the thesis.

Item Type: Thesis (Research Paper)
Supervisor name: Portale, G.
Degree programme: Nanoscience
Thesis type: Research Paper
Language: English
Date Deposited: 09 Jun 2020 10:02
Last Modified: 09 Jun 2020 10:02
URI: https://fse.studenttheses.ub.rug.nl/id/eprint/22042

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