Bosman, Kirsten (2024) Can we quantify the nanoscale roughness effect on ellipsometry measurements? Bachelor's Thesis, Applied Physics.
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Abstract
De begeleider en/of auteur heeft geen toestemming gegeven tot het openbaar maken van de scriptie. The supervisor and/or the author did not authorize public publication of the thesis.
| Item Type: | Thesis (Bachelor's Thesis) |
|---|---|
| Supervisor name: | Palasantzas, G. |
| Degree programme: | Applied Physics |
| Thesis type: | Bachelor's Thesis |
| Language: | English |
| Date Deposited: | 14 Feb 2024 11:46 |
| Last Modified: | 14 Feb 2024 11:46 |
| URI: | https://fse.studenttheses.ub.rug.nl/id/eprint/31941 |
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