Zoest, Nijs van (2025) Characterization and stability study on HfO2-based Resistive RAM devices. Bachelor's Thesis, Applied Physics.
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Abstract
The supervisor and/or the author did not authorize public publication of the thesis.
| Item Type: | Thesis (Bachelor's Thesis) |
|---|---|
| Supervisor name: | Covi, E. and Chicca, E. |
| Degree programme: | Applied Physics |
| Thesis type: | Bachelor's Thesis |
| Language: | English |
| Date Deposited: | 06 Jan 2026 11:28 |
| Last Modified: | 06 Jan 2026 11:28 |
| URI: | https://fse.studenttheses.ub.rug.nl/id/eprint/37204 |
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