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Stainless steel damage study using Digital Imaging Correlation and Orientation Imaging Microscopy

Boonstra, S. and Berg, J.J. van den (2008) Stainless steel damage study using Digital Imaging Correlation and Orientation Imaging Microscopy. Bachelor's Thesis, Physics.

Phys_Bc_2008_S._BoonstraJ.J._v_1.pdf - Published Version

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Damage accumulation during plastic straining of new type of stainless steel JYH21CT is studied experimentally. For a comparison AISI 410 stainless steel is examined too. Both steels are alpha-iron with chromium solute in a state after soft annealing. A special shape of the tensile sample was used to generate a gradient of plastic strain after failure in tensile test. Digital Image Correlation technique was used to characterize the local plastic strain and Orientation Imaging Microscopy (OIM) to quantify accumulation of plastic deformation inside ferritic grains. Standard experimental methods as SEM observation of fractographic surfaces, quantitative optical and SEM metallography observation of voids, X-ray diffraction, EDS measurement and hardness measurements were also used. Fractographic observations reveal that TiN inclusions in JYH21CT steel act as void nucleation sites. The Grain Orientation Spread (GOS) has been found as a good parameter to correlate damage to plastic strain. It is the average misorientation angle within a grain given by OIM analysis. The GOS distribution of a large population of grains has a log-normal distribution. Both Aramis and OIM observations suggest that there are two regions with plastic deformation and damage accumulation. The first region is below 20% of strain and is characterized by a slow strain rate and fast accumulation of the grain orientation spread. In the second region, above 20% of strain, the strain rate is higher and the grain orientation spread grows slower in bulk grains and fully stops to grow in surface grains.

Item Type: Thesis (Bachelor's Thesis)
Degree programme: Physics
Thesis type: Bachelor's Thesis
Language: English
Date Deposited: 15 Feb 2018 07:46
Last Modified: 15 Feb 2018 07:46

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