Homan, Jeroen (2018) Characterization of pure hafnia (HfO2) films grown by Atomic Layer Deposition (ALD). Bachelor's Thesis, Chemistry.
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Abstract
De begeleider en/of auteur heeft geen toestemming gegeven tot het openbaar maken van de scriptie. The supervisor and/or the author did not authorize public publication of the thesis.
Item Type: | Thesis (Bachelor's Thesis) |
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Supervisor name: | Noheda Pinuaga, B. |
Degree programme: | Chemistry |
Thesis type: | Bachelor's Thesis |
Language: | English |
Date Deposited: | 12 Dec 2018 |
Last Modified: | 23 Jan 2019 10:32 |
URI: | https://fse.studenttheses.ub.rug.nl/id/eprint/18932 |
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